Yonny Barcelay received a degree in Physics (2004) from the University of Oriente (Santiago de Cuba, Cuba). Master's Degree in Physical Sciences (2010) from the University of Habana ( Havana, Cuba) and PhD in Physics (2012) from the University of Porto (Porto, Portugal). He is currently a Post-Doc in Physics (2017-2021) in the Federal University of Amazonas (Manaus, Brazil).
Selected Publications:
Morphology, microstructure, and electrocatalytical properties of sol-gel spin-coated Bi0.5Na0.5Ba(TiO3)2 thin films . Applied Surface Science, 2023; 615: 156374.
Carlos Y. P. Batista, Y. Romaguera–Barcelay, Robert S .Matos, Aline Pedraça, Moisés Amâncio, Ansoumane Kourouma, Yurimiler L. Ruiz, Eduardo A. Cotta, Walter R. Brito, Ariamna M. D. Gandarilla, Marcus V. Nascimento, Francisco X. Nobre, Nilson S. Ferreira, Marco Salerno, Henrique D. Filho
DOI: 10.1016/j.apsusc.2023.156374
Poly (thionine)-modified screen-printed electrodes for CA19-9 detection and its properties in Raman spectroscopy. Chemosensors, 2022; 10.
Yuselis Castaño-Guerrero, Y. Romaguera-Barcelay, Felismina Moreira, Walter Ricardo Brito, Elvira Fortunato and Maria G. F. Sales
DOI: 10.3390/chemosensors10030092
Evaluation of nanostructured BiZn0.5Ti0.5O3 thin films deposited by RF magnetron sputtering. . Materials Science and Engineering B-Advanced Functional Solid-State Materials, 2021; v. 267, p. 115090.
Y.Romaguera-Barcelay, A.S.Pedraça, J.A.Moreira, A.Almeida, P.B.Tavares, W.R.Brito, R.S.Matos, M.A.Pires, E.P.Pinto, H.D.da Fonseca Filho
DOI: https://doi.org/10.1016/j.mseb.2021.115090
Handling magnetic and structural properties of EuMnO3 thin films by the combined effect of Lu doping and substrate strain. Journal of Alloys and Compounds, v. 762, p. 319/ 325, 2018.
Y.Romaguera-Barcelaya, F.G.Figueiras, J. Agostinho Moreira, J.Pérez-de-la-Cruz, P.B.Tavares, A.Almeida
DOI: https://doi.org/10.1016/j.jallcom.2018.05.223
Persistence of the orthorhombic phase in YMnO3 hexagonal thin films. J. Persistence of the orthorhombic phase in YMnO hexagonal thin films. Ferroelectrics, v. 498, p. 80-84, 2016.
Y. Romaguera-Barcelay, J. Agostinho Moreira, A. Almeida, P. B. Tavares, L. Fernandes & J. Pérez de la Cruz
DOI: https://doi.org/10.1080/00150193.2016.1168211
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